Extending the Measurement Capabilities of a Model 130 Profilometer-Reference-Cited by-同舟云学术

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Extending the Measurement Capabilities of a Model 130 Profilometer

Published:2019-09 Issue:5 Volume:13 Page:889-893
ISSN:1027-4510
Container-title:Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Akhsakhalyan A. D.,Salashchenko N. N.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451019050203.pdf

Reference18 articles.

1. M. Schuster and H. H. Göbel, J. Phys. D: Appl. Phys. 28, 270 (1995).

2. M. Schuster and H. Göbel, Adv. X-Ray Anal. 39, 57 (1996).

3. U. Shymanovich, M. Nicoul, K. Sokolowski-Tinten, et al., Appl. Phys. B 92, 493 (2008). https://doi.org/10.1007/s00340-008-3138-8

4. A. D. Akhsakhalyan, B. A. Volodin, E. B. Klyuenkov, et al., Poverkhn.: Rentgenovskie, Sinkhrotronnye Neitr. Issled., No. 1, 162 (1999).

5. A. A. Akhsakhalyan, A. D. Akhsakhalyan, V. A. Murav’ev, and A. I. Kharitonov, Poverkhn.: Rentgenovskie, Sinkhrotronnye Neitr. Issled., No. 1, 51 (2002).

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1. Synchrotron radiation-based works at the Novosibirsk research center;Известия Российской академии наук. Серия физическая;2023-05-01

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