Failure-Tolerant Synchronous and Self-Timed Circuits Comparison-Reference-Cited by-同舟云学术

Failure-Tolerant Synchronous and Self-Timed Circuits Comparison

Published:2022-12 Issue:8 Volume:51 Page:630-632
ISSN:1063-7397
Container-title:Russian Microelectronics
language:en
Short-container-title:Russ Microelectron

Author:

Zatsarinny A. A.,Stepchenkov Yu. A.,Diachenko Yu. G.,Rogdestvenski Yu. V.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://link.springer.com/content/pdf/10.1134/S1063739722080091.pdf

Reference10 articles.

1. Viktorova, V.S., Lubkov, N.V., and Stepanyants, A.S., Analiz nadezhnosti otkazoustoichivykh upravlyayushchikh vychislitel’nykh sistem (Reliability Analysis of Fault-Tolerant Control Computing Systems), Moscow: Inst. Probl. Upravl. RAN, 2016. https://www.ipu.ru/sites/default/ files/card_file/VLS.pdf. Accessed June 6, 2022.

2. Alagoz, B.B., Boolean logic with fault tolerant coding, OncuBilim Algorithm Syst. Labs, 2009, vol. 9, p. 03.

3. Dubrova, E., Fault-Tolerant Design, New York: Springer, 2013. https://doi.org/10.1007/978-1-4614-2113-9

4. Zakharov, V., Stepchenkov, Y., Diachenko, Y., and Rogdestvenski, Y., Self-timed circuitry retrospective, in Proceedings of the International Conference Engineering Technologies and Computer Science EnT 2020, Moscow, Russia, 2020, pp. 58–64. https://doi.org/10.1109/EnT48576.2020.00018

5. Stepchenkov, Y.A., Kamenskih, A.N., Diachenko, Y.G., Rogdestvenski, Y.V., and Diachenko, D.Y., Fault-tolerance of self-timed circuits, in Proceedings of the 10th International Conference on Dependable Systems, Services, and Technologies (DESSERT), 2019, Leeds, United Kingdom, pp. 41–44. https://doi.org/10.1109/DESSERT.2019.8770047