Author:
Bizyaev D. A.,Bukharaev A. A.,Ziganshina S. A.,Nurgazizov N. I.,Khanipov T. F.,Chuklanov A. P.
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference17 articles.
1. Valiev, K.A., The Physics of Submicron Lithography (Microdevices), Berlin: Springer, 1992.
2. Handbook of Nanofabrication, Wiederrecht, G.P., Ed., Amsterdam: Elsevier, 2010.
3. Tang, Q., Shi, S.-Q., and Zhou, L., Nanofabrication with atomic force microscopy, J. Nanosci. Nanotech, 2004, vol. 4, p. 948.
4. Garcia, R., Knoll, A.W., and Riedo, E., Advanced scanning probe lithography, Nature Nanotechnol., 2014, vol. 9, p. 577.
5. Bizyaev, D.A., Bukharaev, A.A., Lebedev, D.V., Nurgazizov, N.I., and Khanipov, T.F., Nickel nanoparticles and nanowires obtained by scanning probe lithography using point indentation technique, Tech. Phys. Lett., 2012, vol. 38, p. 645.
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献