Analysis and Prediction of Nanowire TFET’s Work Function Variation
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Published:2024-04-30
Issue:2
Volume:24
Page:96-104
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ISSN:2233-4866
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Container-title:JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
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language:en
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Short-container-title:JSTS
Author:
Hwang Tae-Hyun,Kim Sangwan,Kim Garam,Kim Hyunwoo,Kim Jang-Hyun
Publisher
The Institute of Electronics Engineers of Korea