Localization and integration of diffraction spots from two-dimensional X-ray detector images by digital filtering

Abstract

Abstract A method has been developed to measure background corrected integrated intensities and their standard deviations from two-dimensional diffraction data without prior knowledge of the unit cell parameters or the crystal orientation. Ab initio spot detection and measurement are achieved by digital filtering and classification algorithms. Two test cases are presented showing that the method produces results which are comparable or better than those from standard processing programs.