Zur Kompensation der elektrostatischen Kräfte bei der Messung elektrooptischer Effekte

Abstract

Abstract In usual arrangements for measuring quadratic electrooptic effects the electrostatic attraction of the electrodes produces piezooptic effects, which are of the same order of magnitude as the intrinsic effects. Employing auxiliary electrodes, a full compensation of these stresses within the crystal can be achieved. By these means also the determination of piezooptic constants is possible. The method is tested with several crystals comparing the measured piezooptic constants with literature values.