Author:
Choyke W. J.,Patrick Lyle
Publisher
American Physical Society (APS)
Cited by
94 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Relationship between oxidation, stresses, morphology, local resistivity, and optical properties of TiO2, Gd2O3, Er2O3, SiO2 thin films on SiC;Semiconductor Physics, Quantum Electronics and Optoelectronics;2023-09-20
2. IBIL Measurement and Optical Simulation of the DI Center in 4H-SiC;Materials;2023-04-06
3. Fluorescent Silicon Carbide Nanoparticles;Advanced Optical Materials;2021-07-17
4. Resolving Jahn-Teller induced vibronic fine structure of silicon vacancy quantum emission in silicon carbide;Physical Review B;2021-07-12
5. Comparative characteristics of TiO2(Er2O3, Dy2O3)/por-SiC/SiC heterostructures (Review);Semiconductor Physics, Quantum Electronics and Optoelectronics;2020-09-10