Quantitative measurement of residual biaxial stress by Raman spectroscopy in diamond grown on a Ti alloy by chemical vapor deposition
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.48.2601/fulltext
Reference25 articles.
1. Current Issues and Problems in the Chemical Vapor Deposition of Diamond
2. Low-Pressure, Metastable Growth of Diamond and "Diamondlike" Phases
3. Diamond-Ceramic Coating of the Future
4. Intrinsic stress in diamond films prepared by microwave plasma CVD
5. Characterization of diamond films by Raman spectroscopy
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