Surface relaxation inc(2×2)Cl/Ni(100) determined by the soft-x-ray standing-wave method combined with surface-extended x-ray-absorption fine-structure spectroscopy-Reference-Cited by-同舟云学术

Surface relaxation inc(2×2)Cl/Ni(100) determined by the soft-x-ray standing-wave method combined with surface-extended x-ray-absorption fine-structure spectroscopy

Published:1990-10-15 Issue:11 Volume:42 Page:7000-7005
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Yokoyama T.,Takata Y.,Ohta T.,Funabashi M.,Kitajima Y.,Kuroda H.

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.42.7000/fulltext

Reference24 articles.

1. X-Ray Standing Waves at Crystal Surfaces

2. Solution to the Surface Registration Problem Using X-Ray Standing Waves

3. X-ray standing wave fluorescence measurements in ultra-high vacuum: Adsorption of Br on Si(111)−(1×1)

4. X-ray standing-wave fluorescence analysis of electrodeposited Tl on clean and oxygen-reconstructed Cu(111)

5. Structure of submonolayer gold on silicon (111) from x-ray standing-wave triangulation

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