Mechanism of low-temperature (≤300 °C) crystallization and amorphization for the amorphous Si layer on the crystalline Si substrate by high-energy heavy-ion beam irradiation
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.43.14643/fulltext
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1. Si Bridging Epitaxy from Si Windows onto SiO2byQ-Switched Ruby Laser Pulse Annealing
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