Measurements of depletion layers in hydrogenated amorphous silicon
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.27.4924/fulltext
Reference16 articles.
1. Characterized of glow-discharge deposited a-Si:H
2. Surface states and barrier heights of metal-amorphous silicon schottky barriers
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4. Silicide formation in Pd‐a‐Si:H Schottky barriers
5. Investigation of the density of localized states in a-Si using the field effect technique
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