Voltage drop in the experiments of scanning tunneling microscopy for Si
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.30.2289/fulltext
Reference4 articles.
1. 7 × 7 Reconstruction on Si(111) Resolved in Real Space
2. Tunneling through a controllable vacuum gap
3. Model Theory for Scanning Tunneling Microscopy: Application to Au(110) (1×2)
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