Surface-generation statistics and associated thermal currents in metal-oxide-semiconductor structures
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.11.775/fulltext
Reference5 articles.
1. Thermal Bulk Emission and Generation Statistics and Associated Phenomena in Metal-Insulator-Semiconductor Devices under Non-Steady-State Conditions
2. Statistics of the Recombinations of Holes and Electrons
3. Theory of non-steady-state interfacial thermal currents in MOS devices, and the direct determination of interfacial trap parameters
4. High-Field Isothermal Currents and Thermally Stimulated Currents in Insulators Having Discrete Trapping Levels
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