Suppressive influence of steps on a phase transition of the Si(001) surface
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.57.R4226/fulltext
Reference19 articles.
1. Streak patterns in low-energy electron diffraction on Si(001)
2. Scanning tunneling microscopy of Si(001)
3. Direct observation of an increase in buckled dimers on Si(001) at low temperature
4. Scanning tunneling microscopy at low temperatures on the c(4×2)/(2×1) phase transition of Si(100)
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3. Atomic scale study of corrugating and anticorrugating states on the bare Si(1 0 0) surface;Journal of Physics: Condensed Matter;2014-12-19
4. Visualization of Single Atomic Steps on An Ultra-Flat Si(100) Surface by Advanced Differential Interference Contrast Microscopy;Electrochemical and Solid-State Letters;2011
5. Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopy;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2010-11
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