X-ray photoelectron-diffraction study of intermixing and morphology at the Ge/Si(001) and Ge/Sb/Si(001) interface
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.54.8882/fulltext
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3. Direct observation of elastic strain and relaxation at a metal-metal interface by Auger electron diffraction: Cu/Ni(001)
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