Approach for simultaneous measurement of two-dimensional angular distribution of charged particles: Spherical aberration correction using an ellipsoidal mesh-Reference-Cited by-同舟云学术

Approach for simultaneous measurement of two-dimensional angular distribution of charged particles: Spherical aberration correction using an ellipsoidal mesh

Published:2005-06-28 Issue:6 Volume:71 Page:
ISSN:1539-3755
Container-title:Physical Review E
language:en
Short-container-title:Phys. Rev. E

Author:

Matsuda H.,Daimon H.,Kato M.,Kudo M.

Publisher

American Physical Society (APS)

Subject

Industrial and Manufacturing Engineering,Metals and Alloys,Strategy and Management,Mechanical Engineering

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevE.71.066503/fulltext

Reference40 articles.

1. Angle-resolved photoelectron spectroscopy ofC60

2. Angle-resolved two-dimensional mapping of electron emission following Cl2pexcitations in the HCl molecule

3. Dynamics of strong-field above-threshold ionization of argon: Comparison between experiment and theory

4. Circular dichroism in valence photoelectron spectroscopy of free unoriented chiral molecules: Camphor and bromocamphor

5. Spin- and angle-resolved spectroscopy ofS2pphotoionization in the hydrogen sulfide molecule

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