Comprehensive study of the surface peak in charge-integrated low-energy ion scattering spectra-Reference-Cited by-同舟云学术

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Comprehensive study of the surface peak in charge-integrated low-energy ion scattering spectra

Published:2003-08-20 Issue:2 Volume:68 Page:
ISSN:1050-2947
Container-title:Physical Review A
language:en
Short-container-title:Phys. Rev. A

Author:

Draxler M.,Beikler R.,Taglauer E.,Schmid K.,Gruber R.,Ermolov S. N.,Bauer P.

Publisher

American Physical Society (APS)

Subject

Atomic and Molecular Physics, and Optics

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevA.68.022901/fulltext

Reference12 articles.

1. Small-angle multiple scattering of ions in the screened Coulomb region

3. Rutherford backscattering from a thick target

4. Round Robin comparison of low energy ion scattering by ESA, time-of-flight, stripping technique and computer simulation

5. Positive charge fractions of H, D, and He backscattered from solid surfaces

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