Effects of Oxidation of Top and Bottom Interfaces on the Electric, Magnetic, and Spin-Orbit Torque Properties of Pt / Co / AlOx Trilayers
Author:
Funder
Swiss National Science Foundation
Chinese Scholarship Council
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevApplied.13.044029/fulltext
Reference78 articles.
1. A perpendicular-anisotropy CoFeB–MgO magnetic tunnel junction
2. Current-induced torques in magnetic materials
3. Spin-orbit torque magnetization switching of a three-terminal perpendicular magnetic tunnel junction
4. Magnetoresistive Random Access Memory
5. Crossover from in-plane to perpendicular anisotropy in Pt/CoFe/AlOx sandwiches as a function of Al oxidation: A very accurate control of the oxidation of tunnel barriers
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