Imaging an Acoustic Topological Edge Mode on a Patterned Substrate with Microwave Impedance Microscopy
Author:
Funder
PRESTO
JSPS KAKENHI
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevApplied.19.014001/fulltext
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1. New Method for High-Accuracy Determination of the Fine-Structure Constant Based on Quantized Hall Resistance
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