Electrostatic Force Spectroscopy and Imaging of Bi Wires: Spatially Resolved Quantum Confinement
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.82.3887/fulltext
Reference11 articles.
1. Atomic Force Microscope
2. High‐resolution capacitance measurement and potentiometry by force microscopy
3. Deposition and imaging of localized charge on insulator surfaces using a force microscope
4. Contact electrification using force microscopy
5. Scanning probe microscopy for 2-D semiconductor dopant profiling and device failure analysis
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