Spin polarization of ion-excited secondary electrons from ferromagnets and its application for magnetic sputter depth profiling
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.59.2099/fulltext
Reference24 articles.
1. High-resolution magnetic measurements at surfaces with spin polarized electrons
2. Scanning Electron Microscope Observation of Magnetic Domains Using Spin-Polarized Secondary Electrons
3. HIGH RESOLUTION MAGNETIC MICROSTRUCTURE IMAGING USING SECONDARY ELECTRON SPIN POLARIZATION ANALYSIS IN A SCANNING ELECTRON MICROSCOPE
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