Bistable defect in silicon: The interstitial-carbon–substitutional-carbon pair
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.60.460/fulltext
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1. CdF2:In—A Critical Positive Test of the Toyozawa Model of Impurity Self-Trapping
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3. MFecenter: A configurationally bistable defect in InP: Fe
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