Self-Trapped Excitons in Silicon Dioxide: Mechanism and Properties

Author:

Ismail-Beigi Sohrab,Louie Steven G.

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

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1. Fluence evolution of defects in α-SiO2 determined by ionoluminescence;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-10

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