Effect of tip profile on atomic-force microscope images: A model study
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.60.1314/fulltext
Reference17 articles.
1. Surface Studies by Scanning Tunneling Microscopy
2. Atomic Force Microscope
3. Atomic Resolution with Atomic Force Microscope
4. Theory and Application for the Scanning Tunneling Microscope
5. Multiple-tip interpretation of anomalous scanning-tunneling-microscopy images of layered materials
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