Near- K -Edge Double and Triple Detachment of the F− Negative Ion: Observation of Direct Two-Electron Ejection by a Single Photon-Reference-Cited by-同舟云学术

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Near- K -Edge Double and Triple Detachment of the F− Negative Ion: Observation of Direct Two-Electron Ejection by a Single Photon

Published:2018-03-27 Issue:13 Volume:120 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Müller A.,Borovik A.,Bari S.,Buhr T.,Holste K.,Martins M.,Perry-Saßmannshausen A.,Phaneuf R. A.,Reinwardt S.,Ricz S.,Schubert K.,Schippers S.

Funder

Bundesministerium für Bildung und Forschung

Deutsche Forschungsgemeinschaft

Alexander von Humboldt-Stiftung

Helmholtz Initiative and Networking Fund

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.120.133202/fulltext

Reference37 articles.

1. Atomic negative ions: structure, dynamics and collisions

2. Persistent discrepancy between experimental and theoretical lifetimes forNi−

3. Berechnung der Elektronenaffinit�t des Wasserstoffs

4. Prominent role of multielectron processes inK-shell double and triple photodetachment of oxygen anions

5. Separation and Identification of Dominant Mechanisms in Double Photoionization

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1. Isomer-specific photofragmentation of C₃H₃⁺ at the carbon K-edge;Physical Chemistry Chemical Physics;2024

2. An integrated ion trap for the photon–ion spectrometer at PETRA III;Review of Scientific Instruments;2023-02-01

3. Multiple photodetachment of oxygen anions via K -shell excitation and ionization: Direct double-detachment processes and subsequent deexcitation cascades;Physical Review A;2022-07-28

4. Multiple photodetachment of silicon anions via K -shell excitation and ionization;Physical Review A;2021-11-15

5. Direct double ionization of the Ar+ M shell by a single photon;Physical Review A;2021-03-17

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