Current and voltage noise spectrum due to generation and recombination fluctuations in semiconductors
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.73.035203/fulltext
Reference17 articles.
1. Fluctuations in the number of charge carriers in a semiconductor
2. Electronic noise in semiconductors
3. Generation Recombination Noise in Intrinsic and Near‐Intrinsic Germanium Crystals
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2. Generation-recombination voltage noise spectrum in uniformly doped majority-carrier semiconductor samples;Journal of Applied Physics;2018-10-28
3. Numerical simulation and characterization of trapping noise in InGaP–GaAs heterojunctions devices at high injection;Solid-State Electronics;2013-03
4. Generation-recombination and thermal noise coupling in the drift-diffusion model;Journal of Applied Physics;2007-11-15
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