Profile structures of very thin multilayers by x-ray diffraction using direct and refinement methods of analysis
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.34.5826/fulltext
Reference13 articles.
1. High resolution X-ray diffraction from small numbers of Langmuir-Blodgett layers of manganese stearate
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