Criterion for the size of the scaling regime for the metal-insulator transition of doped semiconductors
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.67.193202/fulltext
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5. Electron-Spin-Resonance Measurements of the Spin Susceptibility of Heavily Dopedn-Type Silicon
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