Sensitivity and resolution in noncontact electrostatic force microscopy in the case of a constant potential
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.71.205419/fulltext
Reference43 articles.
1. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
2. Atomic resolution imaging of InP(110) surface observed with ultrahigh vacuum atomic force microscope in noncontact mode
3. High resolution imaging of contact potential difference using a novel ultrahigh vacuum non-contact atomic force microscope technique
4. Defects and their charge imaging on semiconductor surfaces by noncontact atomic force microscopy and spectroscopy
5. Chemical interactions in noncontact AFM on semiconductor surfaces: Si(111), Si(100) and GaAs(110)
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1. Imaging of electronical and magnetic properties on sub-10 nanometer scale with scanning force microscopy in ambient;Integrated Ferroelectrics;2018-07-24
2. Numerical studies on sub-10 nanometer resolution imaging in electrostatic force microscopy;Integrated Ferroelectrics;2017-07-24
3. Determination of electrostatic force and its characteristics based on phase difference by amplitude modulation atomic force microscopy;Nanoscale Research Letters;2016-12
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