High-resolution photoemission study of the discommensurate(5.55×5.55)Cu/Si(111) surface layer
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.64.235415/fulltext
Reference38 articles.
1. 7 × 7 Si(111)Cu interfaces: Combined LEED, AES and EELS measurements
2. AES, LEED and TDS studies of Cu on Si(111)7 × 7 and Si(100)2 × 1
3. Cu:Si(111) incommensurate (5.55×5.55) surface reconstruction: Helium-beam measurements of diffraction and surface phonons
4. Atomic structure of the Cu/Si(111) interface by high-energy core-level Auger electron diffraction
5. Electronic and atomic structure of the Cu/Si(111) quasi-5×5 overlayer
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