Slow electrons impinging on dielectric solids. II. Implantation profiles, electron mobility, and recombination processes
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.56.2241/fulltext
Reference42 articles.
1. Mobility and surface recombination processes of primary electrons in dielectric systems during Auger electron spectroscopy
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4. A Monte-Carlo calculation of the secondary electron emission of normal metals
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