Annealing influences on phosphorus-ion-implanted vicinal Si(111) studied by reflective second-harmonic generation
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.76.035302/fulltext
Reference24 articles.
1. Second-Harmonic Reflection from Silicon Surfaces and Its Relation to Structural Symmetry
2. Femtosecond-Time-Resolved Surface Structural Dynamics of Optically Excited Silicon
3. Symmetry analysis of second-harmonic generation in silicon
4. Second harmonic generation in centro-symmetric semiconductors
5. Characterization of semiconductor interfaces by second-harmonic generation
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