Test of validity of theV-type approach for electron trajectories in reflection electron energy loss spectroscopy
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.77.245405/fulltext
Reference37 articles.
1. Model for quantitative analysis of reflection-electron-energy-loss spectra
2. Model for quantitative analysis of reflection-electron-energy-loss spectra: Angular dependence
3. Elastic and inelastic scattering of electrons reflected from solids: Effects on energy spectra
4. Electron transport processes in reflection electron energy loss spectroscopy (REELS) and X-ray photoelectron spectroscopy (XPS)
5. Monte Carlo simulation study of reflection-electron-energy-loss-spectroscopy spectrum
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