Abstract
The quality of topographic images obtained using atomic force microscopy strongly depends on the accuracy of the choice of scanning parameters. When using the most common scanning method – semicontact amplitude modulation (tapping) mode, the choice of scanning parameters is quite complicated, since it requires taking into account many factors and finding the optimal balance between them. A researcher’s task can be significantly simplified by introducing new scanning techniques. Two such techniques are described: vertical and dissipation modes. Significantly simplified and formalized choice of the imaging parameters in these modes allows addressing a wide range of formerly challenging tasks – from scanning rough samples with high aspect ratio features to molecular resolution imaging.
Subject
Electrical and Electronic Engineering,General Physics and Astronomy,General Materials Science
Cited by
3 articles.
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