Correlation between in situ structural and optical characterization of the semiconductor-to-metal phase transition of VO2 thin films on sapphire-Reference-Cited by-同舟云学术

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Correlation between in situ structural and optical characterization of the semiconductor-to-metal phase transition of VO2 thin films on sapphire

Published:2020 Issue:2 Volume:12 Page:851-863
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Cesca Tiziana¹²³⁴⁵^ORCID,Scian Carlo¹²³⁴⁵^ORCID,Petronijevic Emilija⁶⁷⁸⁵^ORCID,Leahu Grigore⁶⁷⁸⁵,Li Voti Roberto⁶⁷⁸⁵^ORCID,Cesarini Gianmario⁶⁷⁸⁵⁹,Macaluso Roberto¹⁰¹¹¹²⁵^ORCID,Mosca Mauro¹⁰¹¹¹²⁵^ORCID,Sibilia Concita⁶⁷⁸⁵^ORCID,Mattei Giovanni¹²³⁴⁵^ORCID

Affiliation:

1. University of Padova

2. Department of Physics and Astronomy

3. NanoStructures Group

4. I-35131 Padova

5. Italy

6. Department SBAI

7. Sapienza University of Roma

8. I-00161 Rome

9. INFN

10. Department of Engineering

11. University of Palermo

12. I-90128 Palermo

Abstract

In situ XRD and IR optical measurements demonstrate the coexistence of M₁ and R phases during the SMT transition of VO₂ thin films.

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2020/NR/C9NR09024J

Reference80 articles.

1. Towards properties on demand in quantum materials

2. Light-Induced Tuning and Reconfiguration of Nanophotonic Structures

3. An optoelectronic framework enabled by low-dimensional phase-change films

4. Optical phase change materials in integrated silicon photonic devices: review

5. Oxide Electronics Utilizing Ultrafast Metal-Insulator Transitions

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