The influence of twist angle on the electronic and phononic band of 2D twisted bilayer SiC

Author:

Nguyen Hoa Van12,Nguyen Phi Minh12,Lam Vi Toan12ORCID,Osamu Sugino3,Tran Hanh Thi Thu12ORCID

Affiliation:

1. Laboratory of Computational Physics, Faculty of Applied Science, Ho Chi Minh City University of Technology (HCMUT), 268 Ly Thuong Kiet Street, District 10, Ho Chi Minh City, Vietnam

2. Vietnam National University Ho Chi Minh City, Linh Trung Ward, Thu Duc District, Ho Chi Minh City, Vietnam

3. The Institute for Solid State Physics, The University of Tokyo, Kashiwa, Chiba 277-8581, Japan

Abstract

The height of atoms in the upper and lower layers of 5.1° (a and b), 13.2° (c and d) and 21.8° (e and f) twisted models. The interlayer distances of peaks tend to decrease as the twist angle increases.

Funder

Viet Nam National University Ho Chi Minh City

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemical Engineering,General Chemistry

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