Effects of post-annealing temperature on carbon incorporated amorphous indium–zinc-oxide thin-film transistors fabrication using sputtering at room temperature
Author:
Publisher
Royal Society of Chemistry (RSC)
Subject
General Chemical Engineering,General Chemistry
Link
http://pubs.rsc.org/en/content/articlepdf/2014/RA/C4RA01782J
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1. Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors
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