UV-light microscope: improvements in optical imaging for a secondary ion mass spectrometer-Reference-Cited by-同舟云学术

UV-light microscope: improvements in optical imaging for a secondary ion mass spectrometer

Published:2015 Issue:5 Volume:30 Page:1207-1213
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Kita Noriko T.¹²³⁴⁵,Sobol Peter E.¹²³⁴⁵,Kern James R.¹²³⁴⁵,Lord Neal E.¹²³⁴⁵,Valley John W.¹²³⁴⁵

Affiliation:

1. WiscSIMS

2. Department of Geoscience

3. University of Wisconsin-Madison

4. Madison

5. USA

Abstract

In situ analysis by secondary ion mass spectrometer (SIMS) and other in situ techniques requires accurate aiming of the sample surface at μm scale. Modification of the reflected-light microscope system of an IMS 1280 SIMS to use ultraviolet light illumination improved the optical resolution from 3.5 μm to 1.3 μm.

Funder

National Science Foundation

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2015/JA/C4JA00349G

Reference8 articles.

1. High precision SIMS oxygen isotope analysis and the effect of sample topography

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4. Internal 26Al–26Mg isotope systematics of a Type B CAI: Remelting of refractory precursor solids

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