Use of signal-to-root background ratio as the optimization parameter for inductively coupled plasma atomic emission spectroscopy with charged-coupled device detection-Reference-Cited by-同舟云学术

Use of signal-to-root background ratio as the optimization parameter for inductively coupled plasma atomic emission spectroscopy with charged-coupled device detection

Published:1996 Issue:3 Volume:11 Page:207
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Sadler D. A.,Littlejohn D.,Perkins C. V.

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/1996/JA/JA9961100207

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