Insights into dynamic sliding contacts from conductive atomic force microscopy-Reference-Cited by-同舟云学术

Insights into dynamic sliding contacts from conductive atomic force microscopy

Published:2020 Issue:9 Volume:2 Page:4117-4124
ISSN:2516-0230
Container-title:Nanoscale Advances
language:en
Short-container-title:Nanoscale Adv.

Author:

Chan Nicholas¹²³⁴,Vazirisereshk Mohammad R.⁵⁶⁷⁸^ORCID,Martini Ashlie⁵⁶⁷⁸^ORCID,Egberts Philip¹²³⁴^ORCID

Affiliation:

1. Department of Mechanical and Manufacturing Engineering

2. University of Calgary

3. Calgary

4. Canada

5. School of Engineering

6. University of California Merced

7. Merced

8. USA

Abstract

Measuring the electrical conductivity serves as a proxy for characterizing the nanoscale contact. In this work, the correlation between sliding dynamics and current transport at single asperity sliding contact is investigated.

Funder

Air Force Office of Scientific Research

National Science Foundation

Natural Sciences and Engineering Research Council of Canada

Canada Foundation for Innovation

Publisher

Royal Society of Chemistry (RSC)

Subject

General Engineering,General Materials Science,General Chemistry,Atomic and Molecular Physics, and Optics,Bioengineering

Link

http://pubs.rsc.org/en/content/articlepdf/2020/NA/D0NA00414F

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