Mapping strain modulated electronic structure perturbations in mixed phase bismuth ferrite thin films-Reference-Cited by-同舟云学术

Mapping strain modulated electronic structure perturbations in mixed phase bismuth ferrite thin films

Published:2015 Issue:8 Volume:3 Page:1835-1845
ISSN:2050-7526
Container-title:Journal of Materials Chemistry C
language:en
Short-container-title:J. Mater. Chem. C

Author:

Krishnan P. S. Sankara Rama¹²³⁴,Aguiar Jeffery A.⁵⁶⁷⁸⁹,Ramasse Q. M.¹⁰¹¹¹²¹³,Kepaptsoglou D. M.¹⁰¹¹¹²¹³,Liang W.-I.¹⁴¹⁵¹⁶¹⁷,Chu Y.-H.¹⁴¹⁵¹⁶¹⁷,Browning N. D.¹⁸¹⁹²⁰⁸,Munroe P.¹²³⁴,Nagarajan V.¹²³⁴

Affiliation:

1. School of Materials Science and Engineering

2. University of New South Wales

3. Sydney

4. Australia

5. Material Science and Technology Division

6. Los Alamos National Laboratory

7. Los Alamos

8. USA

9. Materials and Characterization

10. SuperSTEM Laboratory

11. STFC Daresbury Campus

12. Daresbury

13. UK

14. Department of Materials Science and Engineering

15. National Chiao Tung University

16. Hsinchu 30010

17. Taiwan

18. Fundamental and Computational Sciences Directorate

19. Pacific Northwest National Laboratory

20. Richland

Abstract

A combination of atom column-by-column scanning transmission electron microscopy and density functional theory shows how epitaxial strain alters the local electronic structure in mixed phase bismuth ferrite thin films.

Funder

Australian Research Council

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2015/TC/C4TC02064B

Reference61 articles.

1. A Strain-Driven Morphotropic Phase Boundary in BiFeO 3

2. Large field-induced strains in a lead-free piezoelectric material

3. Low-Symmetry Monoclinic Phases and Polarization Rotation Path Mediated by Epitaxial Strain in Multiferroic BiFeO3 Thin Films