Coulomb barrier creation by means of electronic field emission in nanolayer capacitors-Reference-Cited by-同舟云学术

Coulomb barrier creation by means of electronic field emission in nanolayer capacitors

Published:2020 Issue:36 Volume:12 Page:18761-18770
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Ilin Eduard¹²³⁴^ORCID,Burkova Irina¹²³⁴^ORCID,Draher Timothy¹²³⁴^ORCID,Colla Eugene V.¹²³⁴^ORCID,Hübler Alfred¹²³⁴,Bezryadin Alexey¹²³⁴^ORCID

Affiliation:

1. Department of Physics

2. University of Illinois at Urbana-Champaign

3. Urbana

4. USA

Abstract

Electrons tunnel from the cathode into the dielectric, get trapped on defects and build up a volume charge. These immobilized electrons generate an addition barrier, the Coulomb barrier, which reduces the leakage current of the nanocapacitor.

Funder

Air Force Research Laboratory

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2020/NR/D0NR04660D

Reference37 articles.

1. Nanoengineering Strategies for Metal–Insulator–Metal Electrostatic Nanocapacitors

2. NiO Resistive Random Access Memory Nanocapacitor Array on Graphene

3. Origin of the dielectric dead layer in nanoscale capacitors

4. High-Performance Dielectric Ceramic Films for Energy Storage Capacitors: Progress and Outlook

5. Relaxor-ferroelectric thin film heterostructure with large imprint for high energy-storage performance at low operating voltage

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