A hidden phase uncovered by ultrafast carrier dynamics in thin Bi2O2Se

Author:

Li Hao12,Nairan Adeela3,Niu Xiaoran12,Chen Yuxiang4,Sun Huarui4ORCID,Lai Linqing5,Qin Jingkai5,Dang Leyang6,Wang Guigen6,Khan Usman3,He Feng12ORCID

Affiliation:

1. State Key Laboratory on Tunable Laser Technology, Harbin Institute of Technology (Shenzhen), Shenzhen 518055, P. R. China

2. Guangdong Provincial Key Laboratory of Aerospace Communication and Networking Technology, Harbin Institute of Technology (Shenzhen), Shenzhen 518055, P. R. China

3. Institute of Functional Porous Materials, School of Materials Science and Engineering, Zhejiang Sci-Tech University, Hangzhou 310018, P. R. China

4. School of Science and Ministry of Industry and Information Technology, Key Laboratory of Micro-Nano Opto-electronic Information System, Harbin Institute of Technology (Shenzhen), Shenzhen, Guangdong 518055, P. R. China

5. Sauvage Laboratory for Smart Materials, School of Materials Science and Engineering, Harbin Institute of Technology (Shenzhen), Shenzhen 518055, P. R. China

6. Shenzhen Key Laboratory for Advanced Materials, School of Materials Science and Engineering, Harbin Institute of Technology (Shenzhen), Shenzhen 518055, P. R. China

Abstract

A systematic study of thickness- and fluence-dependent carrier dynamics reveals the hidden ferroelectric transition in CVD-grown Bi2O2Se thin films, offering potential applications in optoelectronic devices that benefit from this transition.

Funder

Science and Technology Planning Project of Shenzhen Municipality

China Postdoctoral Science Foundation

National Natural Science Foundation of China

Basic and Applied Basic Research Foundation of Guangdong Province

Publisher

Royal Society of Chemistry (RSC)

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