A combined ab initio and Franck–Condon factor simulation study on the photodetachment spectrum of HfO2−-Reference-Cited by-同舟云学术

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A combined ab initio and Franck–Condon factor simulation study on the photodetachment spectrum of HfO2−

Published:2008 Issue:48 Volume:10 Page:7270
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

Mok Daniel K. W.,Lee Edmond P. F.,Chau Foo-tim,Dyke John M.

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2008/CP/B809863H

Reference27 articles.

1. Radiation Induced Charge Trapping in Ultrathin ${\rm HfO}_{2}$-Based MOSFETs

2. Modeling HfO2/SiO2/Si interface

3. Intrinsic and defect-assisted trapping of electrons and holes in HfO2: an ab initio study

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The low-lying electronic states of HfO2− and HfO2: A symmetry adapted cluster–configuration interaction (SAC-CI) study;Computational and Theoretical Chemistry;2019-09

2. Simulation of the photodetachment spectrum of HHfO− using coupled-cluster calculations;The Journal of Chemical Physics;2016-12-28

3. Simulated photodetachment spectra of AlH2−;The Journal of Chemical Physics;2013-07-07

4. Toward an Understanding of the Hydrogenation Reaction of MO2 Gas-Phase Clusters (M = Ti, Zr, and Hf);The Journal of Physical Chemistry A;2013-06-18

5. High-resolution anion photoelectron spectra of TiO2−, ZrO2−, and HfO2− obtained by slow electron velocity-map imaging;Physical Chemistry Chemical Physics;2013

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