Author:
Festersen Sven,Hrkac Stjepan B.,Koops Christian T.,Runge Benjamin,Dane Thomas,Murphy Bridget M.,Magnussen Olaf M.
Abstract
X-ray reflectivity studies of the structure of liquid–vapour and liquid–liquid interfaces at modern sources, such as free-electron lasers, are currently impeded by the lack of dedicated liquid surface diffractometers. It is shown that this obstacle can be overcome by an alternative experimental approach that uses the natural curvature of a liquid drop for variation of the angle of incidence. Two modes of operation are shown: (i) sequential reflectivity measurements by a nanometre beam and (ii) parallel acquisition of large ranges of a reflectivity curve by micrometre beams. The feasibility of the two methods is demonstrated by studies of the Hg/vapour, H2O/vapour and Hg/0.1 MNaF interface. The obtained reflectivity curves match the data obtained by conventional techniques up to 5αcin micro-beam mode and up to 35αcin nano-beam mode, allowing observation of the Hg layering peak.
Funder
Bundesministerium für Bildung und Forschung
Deutsche Forschungsgemeinschaft
European Synchrotron Radiation Facility
Deutsches Elektronen-Synchrotron
Publisher
International Union of Crystallography (IUCr)
Subject
Instrumentation,Nuclear and High Energy Physics,Radiation
Reference31 articles.
1. Adamson, A. W. & Gast, A. P. (1997). Physical Chemistry of Surfaces. New York: Wiley.
2. Als-Nielsen, J. & McMorrow, D. (2011). Elements of Modern X-ray Physics, 2nd ed. New York: Wiley.
3. Synchrotron X-ray diffraction study of liquid surfaces
4. Bosio, L., Cortes, R., Denoziere, M. & Folcher, G. (1989). J. Phys. Colloq. 50, C7-23-C7-27.
5. Capillary waves on the surface of simple liquids measured by x-ray reflectivity
Cited by
9 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献