1. Characterization of thin layers on perfect crystals with a multipurpose high resolution x-ray diffractometer
2. Beaumont, J. H. & Hart, M. (1974). J. Phys. E: Sci. Instrum. 7, 823-829.
3. The Spectroscopy Village at Diamond Light Source
4. I20; the Versatile X-ray Absorption spectroscopy beamline at Diamond Light Source
5. Duller, G., Kay, J., Amboage, M., Boada, R., Cahill, L., Diaz-Moreno, S., Freeman, A., Gilbert, M., Hayama, S., Leicester, P. & Nutter, B. (2012). Proceedings of the 7th International Conference on Mechanical Engineering Design of Synchrotron Radiation Equipment and Instrumentation (MEDSI'2012), 15-19 October 2012, Shanghai, China.