Energy-dispersive Laue experiments with X-ray tube and PILATUS detector: precise determination of lattice constants

Abstract

A PILATUS detector in combination with a conventional sealed X-ray tube was used for the development of the energy-dispersive Laue diffraction technique, which can be applied for precise measurements of single-crystal lattice constants in transmission and reflection modes without moving the sample. Exploiting the ability of PILATUS detectors to suppress counting of X-ray photons below a certain energy threshold allows one to recover the wavelength of diffracted Bragg reflections, reconstruct the three-dimensional reciprocal-space pattern, index X-ray diffraction peaks, and find the orientation and lattice parameters of the crystal without any a priori information about the sample. By making some geometrical assumptions and using a set of fast in situ calibration procedures, it is possible to simultaneously refine lattice constants and hardware correction factors, which simplifies the sample preparation and measurement strategies. Several samples [silicon, quartz, fluorite (CaF2), o′-Al13Co4 quasicrystal approximant, Laves (MgZn2) and Bergman (Mg32(Al,Zn)49) phases] were studied with the developed technique, and 0.01 Å and 0.1° precisions were routinely reached for lattice vector lengths and angles, respectively. The use of the developed methods is only limited by the energy resolution of the PILATUS detector, where lattice vectors with >27 Å length cannot be reliably resolved.