High-resolution X-ray topographic images of dislocations in a silicon crystal recorded using an X-ray zooming tube
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Published:1998-05-01
Issue:3
Volume:5
Page:1079-1081
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ISSN:0909-0495
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Container-title:Journal of Synchrotron Radiation
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language:
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Short-container-title:J Synchrotron Radiat
Author:
Kimura Shigeru,Matsumura Tatsuya,Kinoshita Katsuyuki,Hirano Keiichi,Kihara Hiroshi
Abstract
A Be-window-type X-ray zooming tube is an X-ray digital imaging system whose magnification factor of X-ray images can be easily varied from 10 to 200, and whose spatial resolution is less than 0.5 µm. This zooming tube was used as an imaging detector in double-crystal X-ray topography to obtain high-resolution images of dislocations in a silicon crystal. X-ray interference images of about 5 µm were observed even though optimal performance of the X-ray zooming tube could not be achieved. The results indicate that the X-ray zooming tube might make a good detector for X-ray topography with minor improvements in its stage structure.
Publisher
International Union of Crystallography (IUCr)
Subject
Instrumentation,Nuclear and High Energy Physics,Radiation
Cited by
7 articles.
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