Calibration of a heating/cooling chamber for X-ray diffraction measurements of mechanical stress and crystallographic texture

Abstract

Methods have been developed for the calibration of specimen temperature and of specimen displacement caused by the thermal expansion of the specimen holder in a heating/cooling chamber equipped with a strip or plate heater mounted on an X-ray diffractometer. For the temperature calibration two methods were proposed. One method relies on X-ray diffraction measurements of thermal lattice strains, whereas the other method is based on resistance thermometry. The method proposed for the determination of the temperature-dependent specimen displacement is based on the measurement of diffraction-line positions of the specimen employing two diffraction geometries, one being sensitive to the specimen displacement and the other being insensitive to the specimen displacement. The thermal displacement of the specimen due to thermal expansion of the specimen holder is significant and was determined as about 38 µm per 100 K.