Abstract
A structural analysis using a new, simple model describing the stacking structure of nongraphitic carbons is presented. The model is based on the idea that there is only a nearest-neighbour interaction between carbon layers. The nearest-neighbour interaction is described by the distribution of interlayer dist-ances, which, assuming a linear conjugate of two independent Gaussian distributions, gives a good fit to the obtained X-ray diffraction profile of carbon. This model is applied to a heat-treated series of nongraphitizing carbons from phenolic resin. The result shows that the average interlayer distances are about 0.4 nm. The model allows the diffraction intensity from carbon layers and the scattering intensity due to the porous structure of the carbon samples to be differentiated.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
16 articles.
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